Tracing through reset

ABSTRACT

A method of tracing a data processor upon reset of the data processor. A data processor reset signal resets the data processor, part of trace collection hardware and does not reset remaining parts of trace collection hardware. The data processor reset signal may be not owned, owned by an application program or owned by a debugger. The partial not reset of the trace collection hardware occurs only upon a data processor reset signal owned by the debugger. A trace logic reset signal resets both the data processor and the trace collection hardware when not owned. This trace logic reset signal resets the data processor only when owned by the debugger and resets the trace collection hardware when owned by an application program.

This application is a divisional of U.S. patent application Ser. No.11/359,158 filed Feb. 21, 2006, which is a divisional of U.S. patentapplication Ser. No. 10/302,082 filed Nov. 22, 2002 (now U.S. Pat. No.7,051,197), both of which are incorporated herein by reference.

TECHNICAL FIELD OF THE INVENTION

The technical field of this invention is emulation hardware particularlyfor highly integrated digital signal processing systems.

BACKGROUND OF THE INVENTION

Advanced wafer lithography and surface-mount packaging technology areintegrating increasingly complex functions at both the silicon andprinted circuit board level of electronic design. Diminished physicalaccess to circuits for test and emulation is an unfortunate consequenceof denser designs and shrinking interconnect pitch. Designed-intestability is needed so the finished product is both controllable andobservable during test and debug. Any manufacturing defect is preferablydetectable during final test before a product is shipped. This basicnecessity is difficult to achieve for complex designs without takingtestability into account in the logic design phase so automatic testequipment can test the product.

In addition to testing for functionality and for manufacturing defects,application software development requires a similar level of simulation,observability and controllability in the system or sub-system designphase. The emulation phase of design should ensure that a system of oneor more ICs (integrated circuits) functions correctly in the endequipment or application when linked with the system software. With theincreasing use of ICs in the automotive industry, telecommunications,defense systems, and life support systems, thorough testing andextensive real-time debug becomes a critical need.

Functional testing, where the designer generates test vectors to ensureconformance to specification, still remains a widely used testmethodology. For very large systems this method proves inadequate inproviding a high level of detectable fault coverage. Automaticallygenerated test patterns are desirable for full testability, andcontrollability and observability. These are key goals that span thefull hierarchy of test from the system level to the transistor level.

Another problem in large designs is the long time and substantialexpense involved in design for test. It would be desirable to havetestability circuitry, system and methods that are consistent with aconcept of design-for-reusability. In this way, subsequent devices andsystems can have a low marginal design cost for testability, simulationand emulation by reusing the testability, simulation and emulationcircuitry, systems and methods that are implemented in an initialdevice. Without a proactive testability, simulation and emulation plan,a large amount of subsequent design time would be expended on testpattern creation and upgrading.

Even if a significant investment were made to design a module to bereusable and to fully create and grade its test patterns, subsequent useof a module may bury it in application specific logic. This would makeits access difficult or impossible. Consequently, it is desirable toavoid this pitfall.

The advances of IC design are accompanied by decreased internalvisibility and control, reduced fault coverage and reduced ability totoggle states, more test development and verification problems,increased complexity of design simulation and continually increasingcost of CAD (computer aided design) tools. In the board design the sideeffects include decreased register visibility and control, complicateddebug and simulation in design verification, loss of conventionalemulation due to loss of physical access by packaging many circuits inone package, increased routing complexity on the board, increased costsof design tools, mixed-mode packaging, and design for produceability. Inapplication development, some side effects are decreased visibility ofstates, high speed emulation difficulties, scaled time simulation,increased debugging complexity, and increased costs of emulators.Production side effects involve decreased visibility and control,complications in test vectors and models, increased test complexity,mixed-mode packaging, continually increasing costs of automatic testequipment and tighter tolerances.

Emulation technology utilizing scan based emulation and multiprocessingdebug was introduced more than 10 years ago. In 1988, the change fromconventional in circuit emulation to scan based emulation was motivatedby design cycle time pressures and newly available space for on-chipemulation. Design cycle time pressure was created by three factors.Higher integration levels, such as increased use of on-chip memory,demand more design time. Increasing clock rates mean that emulationsupport logic causes increased electrical intrusiveness. Moresophisticated packaging causes emulator connectivity issues. Today thesesame factors, with new twists, are challenging the ability of a scanbased emulator to deliver the system debug facilities needed by today'scomplex, higher clock rate, highly integrated designs. The resultingsystems are smaller, faster, and cheaper. They have higher performanceand footprints that are increasingly dense. Each of these positivesystem trends adversely affects the observation of system activity, thekey enabler for rapid system development. The effect is called“vanishing visibility.”

FIG. 1 illustrates the trend in visibility and control over time andgreater system integration. Application developers prefer the optimumvisibility level illustrated in FIG. 1. This optimum visibility levelprovides visibility and control of all relevant system activity. Thesteady progression of integration levels and increases in clock ratessteadily decrease the actual visibility and control available over time.These forces create a visibility and control gap, the difference betweenthe optimum visibility and control level and the actual level available.Over time, this gap will widen. Application development tool vendors arestriving to minimize the gap growth rate. Development tools software andassociated hardware components must do more with less resources and indifferent ways. Tackling this ease of use challenge is amplified bythese forces.

With today's highly integrated System-On-a-Chip (SOC) technology, thevisibility and control gap has widened dramatically over time.Traditional debug options such as logic analyzers and partitionedprototype systems are unable to keep pace with the integration levelsand ever increasing clock rates of today's systems. As integrationlevels increase, system buses connecting numerous subsystem componentsmove on chip, denying traditional logic analyzers access to these buses.With limited or no significant bus visibility, tools like logicanalyzers cannot be used to view system activity or provide the triggermechanisms needed to control the system under development. A loss ofcontrol accompanies this loss in visibility, as it is difficult tocontrol things that are not accessible.

To combat this trend, system designers have worked to keep these busesexposed. Thus the system components were built in a way that enabled theconstruction of prototyping systems with exposed buses. This approach isalso under siege from the ever-increasing march of system clock rates.As the central processing unit (CPU) clock rates increase, chip to chipinterface speeds are not keeping pace. Developers find that apartitioned system's performance does not keep pace with its integratedcounterpart, due to interface wait states added to compensate forlagging chip to chip communication rates. At some point, thisperformance degradation reaches intolerable levels and the partitionedprototype system is no longer a viable debug option. In the current eraproduction devices must serve as the platform for applicationdevelopment.

Increasing CPU clock rates are also limiting availability of othersimple visibility mechanisms. Since the CPU clock rates can exceed themaximum I/O state rates, visibility ports exporting information innative form can no longer keep up with the CPU. On-chip subsystems arealso operated at clock rates that are slower than the CPU clock rate.This approach may be used to simplify system design and reduce powerconsumption. These developments mean simple visibility ports can nolonger be counted on to deliver a clear view of CPU activity. Asvisibility and control diminish, the development tools used to developthe application become less productive. The tools also appear harder touse due to the increasing tool complexity required to maintainvisibility and control. The visibility, control, and ease of use issuescreated by systems-on-a-chip tend to lengthen product developmentcycles.

Even as the integration trends present developers with a tough debugenvironment, they also present hope that new approaches to debugproblems will emerge. The increased densities and clock rates thatcreate development cycle time pressures also create opportunities tosolve them. On-chip, debug facilities are more affordable than everbefore. As high speed, high performance chips are increasingly dominatedby very large memory structures, the system cost associated with therandom logic accompanying the CPU and memory subsystems is dropping as apercentage of total system cost. The incremental cost of severalthousand gates is at an all time low. Circuits of this size may in somecases be tucked into a corner of today's chip designs. The incrementalcost per pin in today's high density packages has also dropped. Thismakes it easy to allocate more pins for debug. The combination ofaffordable gates and pins enables the deployment of new, on-chipemulation facilities needed to address the challenges created bysystems-on-a-chip.

When production devices also serve as the application debug platform,they must provide sufficient debug capabilities to support time tomarket objectives. Since the debugging requirements vary with differentapplications, it is highly desirable to be able to adjust the on-chipdebug facilities to balance time to market and cost needs. Since theseon-chip capabilities affect the chip's recurring cost, the scalabilityof any solution is of primary importance. “Pay only for what you need”should be the guiding principle for on-chip tools deployment. In thisnew paradigm, the system architect may also specify the on-chip debugfacilities along with the remainder of functionality, balancing chipcost constraints and the debug needs of the product development team.

FIG. 2 illustrates a prior art emulator system 100 including fouremulator components. These four components are: a debugger applicationprogram 110; a host computer 120; an emulation controller 130; andon-chip debug facilities 140. FIG. 2 illustrates the connections ofthese components. Host computer 120 is connected to an emulationcontroller 130 external to host 120. Emulation controller 130 is alsoconnected to target system 140. The user preferably controls the targetapplication on target system 140 through debugger application program110.

Host computer 120 is generally a personal computer. Host computer 120provides access the debug capabilities through emulator controller 130.Debugger application program 110 presents the debug capabilities in auser-friendly form via host computer 120. The debug resources areallocated by debug application program 110 on an as needed basis,relieving the user of this burden. Source level debug utilizes the debugresources, hiding their complexity from the user. Debugger applicationprogram 110 together with the on-chip trace and triggering facilitiesprovide a means to select, record, and display chip activity ofinterest. Trace displays are automatically correlated to the source codethat generated the trace log. The emulator provides both the debugcontrol and trace recording function.

The debug facilities are preferably programmed using standard emulatordebug accesses through a JTAG or similar serial debug interface. Sincepins are at a premium, the preferred embodiment of the inventionprovides for the sharing of the debug pin pool by trace, trigger, andother debug functions with a small increment in silicon cost. Fixed pinformats may also be supported. When the pin sharing option is deployed,the debug pin utilization is determined at the beginning of each debugsession before target system 140 is directed to run the applicationprogram. This maximizes the trace export bandwidth. Trace bandwidth ismaximized by allocating the maximum number of pins to trace.

The debug capability and building blocks within a system may vary.Debugger application program 100 therefore establishes the configurationat runtime. This approach requires the hardware blocks to meet a set ofconstraints dealing with configuration and register organization. Othercomponents provide a hardware search capability designed to locate theblocks and other peripherals in the system memory map. Debuggerapplication program 110 uses a search facility to locate the resources.The address where the modules are located and a type ID uniquelyidentifies each block found. Once the IDs are found, a design databasemay be used to ascertain the exact configuration and all system inputsand outputs.

Host computer 120 generally includes at least 64 Mbytes of memory and iscapable of running Windows 95, SR-2, Windows NT, or later versions ofWindows. Host computer 120 must support one of the communicationsinterfaces required by the emulator. These may include: Ethernet 10 Tand 100 T, TCP/IP protocol; Universal Serial Bus (USB); Firewire IEEE1394; and parallel port such as SPP, EPP and ECP.

Host computer 120 plays a major role in determining the real-time dataexchange bandwidth. First, the host to emulator communication plays amajor role in defining the maximum sustained real-time data exchangebandwidth because emulator controller 130 must empty its receivereal-time data exchange buffers as fast as they are filled. Secondly,host computer 120 originating or receiving the real-time data exchangedata must have sufficient processing capacity or disc bandwidth tosustain the preparation and transmission or processing and storing ofthe received real-time data exchange data. A state of the art personalcomputer with a Firewire communication channel (IEEE 1394) is preferredto obtain the highest real-time data exchange bandwidth. This bandwidthcan be as much as ten times greater performance than other communicationoptions.

Emulation controller 130 provides a bridge between host computer 120 andtarget system 140. Emulation controller 130 handles all debuginformation passed between debugger application program 110 running onhost computer 120 and a target application executing on target system140. A presently preferred minimum emulator configuration supports allof the following capabilities: real-time emulation; real-time dataexchange; trace; and advanced analysis.

Emulation controller 130 preferably accesses real-time emulationcapabilities such as execution control, memory, and register access viaa 3, 4, or 5 bit scan based interface. Real-time data exchangecapabilities can be accessed by scan or by using three higher bandwidthreal-time data exchange formats that use direct target to emulatorconnections other than scan. The input and output triggers allow othersystem components to signal the chip with debug events and vice-versa.Bit I/O allows the emulator to stimulate or monitor system inputs andoutputs. Bit I/O can be used to support factory test and other lowbandwidth, non-time-critical emulator/target operations. Extendedoperating modes are used to specify device test and emulation operatingmodes. Emulator controller 130 is partitioned into communication andemulation sections. The communication section supports hostcommunication links while the emulation section interfaces to thetarget, managing target debug functions and the device debug port.Emulation controller 130 communicates with host computer 120 using oneof industry standard communication links outlined earlier herein. Thehost to emulator connection is established with off the shelf cablingtechnology. Host to emulator separation is governed by the standardsapplied to the interface used.

Emulation controller 130 communicates with the target system 140 througha target cable or cables. Debug, trace, triggers, and real-time dataexchange capabilities share the target cable, and in some cases, thesame device pins. More than one target cable may be required when thetarget system 140 deploys a trace width that cannot be accommodated in asingle cable. All trace, real-time data exchange, and debugcommunication occurs over this link. Emulator controller 130 preferablyallows for a target to emulator separation of at least two feet. Thisemulation technology is capable of test clock rates up to 50 MHZ andtrace clock rates from 200 to 300 MHZ, or higher. Even though theemulator design uses techniques that should relax target system 140constraints, signaling between emulator controller 130 and target system140 at these rates requires design diligence. This emulation technologymay impose restrictions on the placement of chip debug pins, boardlayout, and requires precise pin timings. On-chip pin macros areprovided to assist in meeting timing constraints.

The on-chip debug facilities offer the developer a rich set ofdevelopment capability in a two tiered, scalable approach. The firsttier delivers functionality utilizing the real-time emulation capabilitybuilt into a CPU's mega-modules. This real-time emulation capability hasfixed functionality and is permanently part of the CPU while the highperformance real-time data exchange, advanced analysis, and tracefunctions are added outside of the core in most cases. The capabilitiesare individually selected for addition to a chip. The addition ofemulation peripherals to the system design creates the second tierfunctionality. A cost-effective library of emulation peripheralscontains the building blocks to create systems and permits theconstruction of advanced analysis, high performance real-time dataexchange, and trace capabilities. In the preferred embodiment fivestandard debug configurations are offered, although customconfigurations are also supported. The specific configurations arecovered later herein.

SUMMARY OF THE INVENTION

A user may wish to diagnose the reason for resetting a data processor.Since the trace in the emulation is not reset upon functional reset, theuser can have full visibility in the processor using the tracecapability. This invention proposes real time tracing of data processoractivity. The trace data enables program debug and analysis. Thisinvention enables full visibility of data processor activity via tracethrough functional reset. The user can then view the trace data todiagnose the instruction address, data or data address that caused thefunctional reset.

BRIEF DESCRIPTION OF THE DRAWINGS

These and other aspects of this invention are illustrated in thedrawings, in which:

FIG. 1 illustrates the visibility and control of typical integratedcircuits as a function of time due to increasing system integration;

FIG. 2 illustrates an emulation system to which this invention isapplicable (prior art);

FIG. 3 illustrates in block diagram form a typical integrated circuitemploying configurable emulation capability (prior art);

FIG. 4 illustrates in block diagram form a detail of the tracecollection hardware according to this invention;

FIG. 5 illustrates in block diagram form the pipeline flattener of thisinvention;

FIG. 6 illustrates in block diagram form one embodiment of the slidingalignment correction circuit of this invention; and

FIG. 7 illustrates in block diagram form an alternative embodiment ofthe sliding alignment correction circuit of this invention.

DETAILED DESCRIPTION OF PREFERRED EMBODIMENTS

Even though the processor gets reset on a functional reset, theemulation hardware can give the user full diagnostic capability for thereason of the reset. The user can trace the timing stream to get an ideaof when and how long the reset lasted. The user can use the programcounter and data streams to diagnose the addresses/data values thatcould have lead to the reset.

FIG. 3 illustrates an example of a prior art one on-chip debugarchitecture embodying target system 140. The architecture uses severalmodule classes to create the debug function. One of these classes isevent detectors including bus event detectors 210, auxiliary eventdetectors 211 and counters/state machines 213. A second class of modulesis trigger generators including trigger builders 220. A third class ofmodules is data acquisition including trace collection 230 andformatting. A fourth class of modules is data export including traceexport 240, and real-time data exchange export 241. Trace export 240 iscontrolled by clock signals from local oscillator 245. Local oscillator245 will be described in detail below. A final class of modules is scanadaptor 250, which interfaces scan input/output to CPU core 201. Finaldata formatting and pin selection occurs in pin manager and pin micros260.

The size of the debug function and its associated capabilities for anyparticular embodiment of a system-on-chip may be adjusted by eitherdeleting complete functions or limiting the number of event detectorsand trigger builders deployed. Additionally, the trace function can beincrementally increased from program counter trace only to programcounter and data trace along with ASIC and CPU generated data. Thereal-time data exchange function may also be optionally deployed. Theability to customize on-chip tools changes the application developmentparadigm. Historically, all chip designs with a given CPU core werelimited to a fixed set of debug capability. Now, an optimized debugcapability is available for each chip design. This paradigm change givessystem architects the tools needed to manage product development risk atan affordable cost. Note that the same CPU core may be used withdiffering peripherals with differing pin outs to embody differingsystem-on-chip products. These differing embodiments may requirediffering debug and emulation resources. The modularity of thisinvention permits each such embodiment to include only the necessarydebug and emulation resources for the particular system-on-chipapplication.

The real-time emulation debug infrastructure component is used to tacklebasic debug and instrumentation operations related to applicationdevelopment. It contains all execution control and register visibilitycapabilities and a minimal set of real-time data exchange and analysissuch as breakpoint and watchpoint capabilities. These debug operationsuse on-chip hardware facilities to control the execution of theapplication and gain access to registers and memory. Some of the debugoperations which may be supported by real-time emulation are: setting asoftware breakpoint and observing the machine state at that point;single step code advance to observe exact instruction by instructiondecision making; detecting a spurious write to a known memory location;and viewing and changing memory and peripheral registers.

Real-time emulation facilities are incorporated into a CPU mega-moduleand are woven into the fabric of CPU core 201. This assures designsusing CPU core 201 have sufficient debug facilities to support debuggerapplication program 110 baseline debug, instrumentation, and datatransfer capabilities. Each CPU core 201 incorporates a baseline set ofemulation capabilities. These capabilities include but are not limitedto: execution control such as run, single instruction step, halt andfree run; displaying and modifying registers and memory; breakpointsincluding software and minimal hardware program breakpoints; andwatchpoints including minimal hardware data breakpoints.

FIG. 4 illustrates a detail of trace collection 230. Trace collection230 hardware gets new trace data from the CPU core 201 every cycle. Thistrace comes form different pipeline stages of CPU core 201. Pipelineflattener 401 combines all data from different clock cycles within theinstruction pipeline that correspond to the same instruction. The datafor each instruction is complete at the output of pipeline flattener401. Alignment logic 402 aligns the data coming from other parts of theemulation logic with the output of pipeline flattener 401. This datathen goes to trace logic 403.

FIG. 5 illustrates the pipeline flattener 401 of this invention.Pipeline flattener 401 achieves alignment of program counter (pc),pipeline-flow control information (pct1), memory access control(mem_acc_ct1), memory access address (mem_addr), memory access writedata (wr_data) and memory access read data (rd_data).

Alignment is implemented in 2 steps. First, the data collected in earlystages of the pipeline is aligned in a per case bases in order toaccount for the differences in the data collection behavior. Thispresents a simpler group of data to the second processing step.Heterogeneous stage aligner 510 performs this initial alignment step.Second, the data collected in the first step presents a single type ofbehavior. The 3-stage delay pipeline 530 aligns this data from the firststage as a group to the last arriving memory access read data (rd_data).

The point of collection of the last arriving memory access read data(rd_data) is the target point of alignment. In this example this pointof collection is stage 5 of the pipeline (e5). As a first step towardsthe final alignment goal, the early arriving data is processed invarious ways and aligned via heterogeneous stage aligner 510 to thesecond stage of the pipeline (e2). In order to be considered fullyaligned to e2, the data should not be updated at the beginning of theclock cycle if the pipeline did not advance in the previous cycle. Thisis indicated by cpu_stall=1 in previous cycle. For the exampleillustrated in FIG. 5 there are 5 sources of early arriving data programcounter (pc), pipeline-flow control information (pctl), memory accesscontrol (mem_acc_ct1), memory access address (mem_addr) and memoryaccess write data (wr_data). These represent 3 independent dataretention policies and require 3 different mechanisms in order to bealigned to pipeline state e2 as a group.

The pipeline-flow control information (pct1) data group is collected inpipeline stage el. This data has a data retention policy similar to thepolicy of any stage in the architectural pipeline. Thus all that isrequired to align pipeline-flow control information (pct1) to pipelinestage e2 is the single stage pipeline delay element 511. Pipeline delayelement 511 is implemented by a single register stage that updates whenthe pipeline advances (cpu_stall=0).

A second set of early collected data is the program counter (pc). Theprogram counter is generated in pipeline stage e0. The program counteris delayed 1 clock cycle via a single register stage (not shown) andthen presented at the input of heterogeneous stage aligner 510 as thesignal pc_e0+1 clock delay. Program counter (pc) data is aligned topipeline stage e2 via a single register stage in pipeline delay element512. Pipeline delay element 512 updates only when the pipeline advances(cpu_stall=0) and only if the current instruction in pipeline state e1is a new instruction (inst_exe=1). OR gate 513 advances receives thecpu_stall signal and the inst_exe signal and insures pipeline delayelement 512 advances only under these conditions. Enforcing these 2conditions ensures that the aligned program counter (pc) value inpipeline stage e2 during multicycle instructions remains the same duringall the cycles it takes to execute the instruction. This retention is inspite of the fact that the program counter (pc) retention policy willoverwrite the program counter (pc) value presented after the first clockcycle of the instruction in pipeline stage e1.

The three remaining sets of early collected data are related to memoryaccesses. These are memory access control (mem_acc_ct1), memory accessaddress (mem_addr) and memory access write data (wr_data). For theparticular implementation illustrated in FIG. 5, the three sources ofdata have a similar data retention policy and are collected in the samepipeline stages. Thus the same mechanism is used in order to align themto pipeline state e2. These 3 pieces of data are architecturallygenerated in pipeline stage e2. However, due to some special needs ofthis particular implementation there are a few exceptional cases wherethe memory access data is collected in pipeline stages e1 and e0 ratherthan pipeline stage e2.

Memory access elastic buffer 520 copes with these alternatives. Receivedmemory access control data (mem_acc_ct1) supplies the input to two stagepipeline delay element 521, the input to multiplexer 522 and an input toelastic buffer control 523. The memory access address (mem_addr) andmemory access write data (wr_data) supply the input to pipeline delayelement 521 and multiplexer 522. It should be understood that the memoryaccess control data (mem_acc_ct1), the memory access address (mem_addr)and memory access write data (wr_data) are handled in parallel inpipeline delay element 521 and multiplexer 522.

The memory access control data (mem_acc_ct1) indicates the pipelinestage of collection of the memory access signals. Elastic buffer control523 uses this indication to control pipeline delay element 521 andmultiplexer 522. If the memory access data was collected during pipelinestage e2, then elastic buffer control 523 sends a select signal tomultiplexer 522 to select the directly received memory access signals.If the memory access data was collected during pipeline stage e1, thenelastic buffer control 523 sends a select signal to multiplexer 522 toselect memory access signals from pipeline delay element 521. Elasticbuffer control 523 also controls pipeline delay element 521 to insertone pipeline stage delay. If the memory access data was collected duringpipeline stage e0, then elastic buffer control 523 sends a select signalto multiplexer 522 to select memory access signals from pipeline delayelement 521. Elastic buffer control 523 also controls pipeline delayelement 521 to insert two pipeline stage delays. This behavior issummarized in Table 1. TABLE 1 Data Multiplexer Pipeline delay collected522 select element 521 e0 delayed data 2 stage delay e1 delayed data 1stage delay e2 direct data —

The 3-stage delay pipeline 530 takes the homogeneously behaved data atits input already aligned to the second pipeline stage e2. Three-stagedelay pipeline 530 includes pipeline delay element 531 for the memoryaccess data, pipeline delay element 532 for the program counter data andpipeline delay element 533 for the pipeline-flow control information.Three-stage delay pipeline 530 outputs this data at pipeline stage e5.This is the same stage as the arrival of the read data (rd_data).Three-stage delay pipeline 530 sends every bit of input data through 3serially connected registers that update its content every clock cyclesthat the pipeline is not stalled (cpu_stall=0). The clock signal clk1 issupplied to pipeline delay elements 511 and 512 and to every register ofpipeline delay elements 521, 531, 532 and 533. The cpu_stall signalstalls pipeline delay elements 511, 512, 531, 532 and 533 when thecentral processing unit is stalled. Since the memory access data is notupdated by heterogeneous stage aligner 510 during pipeline stall cycles,no data is lost during pipeline stalls. Pipeline flattener 401effectively aligns the program counter (pc), pipeline-flow controlinformation (pct1), memory access control (mem_acc_ct1), memory accessaddress (mem_addr), memory access write data (wr_data) to the latereceived read data (rd_data) in pipeline stage e5.

FIG. 6 illustrates alignment circuit 402 in one embodiment of thisinvention. The data presented at the input of this circuit is aligned tothe cycle and pipeline stage where the last set of data, the memoryaccess read data (rd_data), becomes available. In this example the dataprocessor has a five stage pipeline. Thus the write data (wr_data_e5),memory access control data (mem_acc_ct1_e5), memory address(mem_addr_e5), program counter (pc_e5) and pipeline-flow controlinformation (pct1_e5) has been aligned with the late arriving read data(rd_data) in pipeline stage e5.

In FIG. 6 although all the data presented at the input of the circuit isbe aligned to pipeline stage e5, there is an issue with 1 clock cyclesliding of read data (rd_data) that could cause it not to be correctlycaptured if the pipeline stalls. The 1 clock cycle sliding of read data(rd_data) happens when the read data (rd_data) presented at the inputboundary of the circuit as it updates one more cycle once the pipelinestalls. As part of this behavior the same source of read data (rd_data)will not be updated like the rest of the aligned data at the beginningof the second pipeline advance cycle after the stall. In other words the1 cycle sliding of the read data (rd_data) could be described as a 1cycle delay in response to the stall or advance taking place in thepipeline.

In order to prevent the potential lost of the read data, additionalregistering stage is inserted in the path of the data. This one pipelinestage delay is implemented via pipeline delay elements 601, 602, 603,604 and 605. The pipeline delay element 605 provides storage to capturethe read data (rd_data) and eliminates the loss of read data associatedwith the instruction in pipeline state e5 being overwritten when theread data in pipeline stage e4 slides into pipeline stage e5 during thefirst cycle of a CPU stall window. Pipeline delay elements 601, 602, 603and 604 do not hold data and have been added as delay elements tocompensate for the delay of pipeline delay register 605, which capturesand holds the read data. In order to remove the 1 clock slide in theread data, the hold signal supplied to pipeline delay register 605 is a1 clock delayed version of the pipeline stall signal (cpu_stall)provided by delay element 606.

FIG. 6 illustrates two additional register stages in each data path:pipeline delay elements 611 and 621 in the write data path, pipelinedelay elements 612 and 622 in the memory access control data and thememory address paths; pipeline delay elements 613 and 624 in the programcounter path; pipeline delay elements 614 and 624 in the pipeline-flowcontrol information path; and pipeline delay elements 615 and 625 in theread data path. These two additional stages add additional latencyspecific to this implementation of the preferred embodiment of theinvention. The 3 additional register stages alignment circuit 602 do notrepresent additional pipeline stages, they only add clock latency to theimplementation. The data at the output of alignment circuit 602 is thecontents of pipeline stage e5 in the pipeline delayed by 3 clock cycles.

The correction to the N-bit sliding on the memory data is done via anN-bit slide operation in the opposite direction to the slide of thedata. The data bus is assumed to be 2 words wide in this embodiment. Thesliding of data at the input is limited to a swapping between the upperand lower words of the bus. Shift correction circuit 630 receives thememory access control signal and detects the sliding condition. Shiftcorrection circuit 630 controls multiplexers 631, 632, 633, and 634 toenable or disable a swap of the most significant and least significantbits. In order to restore the architectural view of the data it isnecessary to align the least significant bits of the write data and theread data to the least significant bits of the data bus. On a normalstate of the multiplexer control signal from shift control circuit 630multiplexer 631 selects the most significant bits from pipeline delayelement 601 to output to the most significant bits of pipeline delayelement 611, multiplexer 632 selects the least significant bits frompipeline delay element 601 output to the least significant bits ofpipeline delay element 611, multiplexer 633 selects the most significantbits from pipeline delay element 605 to output to the most significantbits of pipeline delay element 615, multiplexer 634 selects the leastsignificant bits from pipeline delay element 605 output to the leastsignificant bits of pipeline delay element 611. In the opposite swapstate multiplexer 631 selects the least significant bits from pipelinedelay element 601 to output to the most significant bits of pipelinedelay element 611, multiplexer 632 selects the most significant bitsfrom pipeline delay element 601 output to the least significant bits ofpipeline delay element 611, multiplexer 633 selects the leastsignificant bits from pipeline delay element 605 to output to the mostsignificant bits of pipeline delay element 615, multiplexer 634 selectsthe most significant bits from pipeline delay element 605 output to theleast significant bits of pipeline delay element 611. This swaps themost significant bits with the least significant bits of both the writedata and the read data.

FIG. 7 illustrates alignment circuit 700 in an alternative embodiment ofthis invention. In this alternative clock delay elements 601, 602, 603and 604 are replaced with respective pipeline delays elements 701, 702,703 and 704. An additional pipeline delay has been added by holding thecontents of pipeline delay elements 701, 702, 703, and 704 by connectingtheir hold inputs to the cpu_stall signal. As a result the pipeline dataaligned to pipeline stage e5 presented as input of adjustment circuit700 will require that the pipeline advances one more stage to pipelinestage e6, before it could be propagated via 2 stages of latency to theoutput.

Reset for the trace logic and CPU core 201 is qualified as shown inTable 2. Table 2 gives some background knowledge about interaction ofreset, CPU core 201 and trace. TABLE 2 Trace Functional Logic ResetReset Unit owned by reset reset CPU Trace Not owned Y — Y Y Not owned —Y Y Y Application Y N Y Y Application N Y N N Debugger Y N Y N DebuggerN Y N Y

Pipeline flattener 401 and alignment logic 402 are reset when CPU core201 resets. However trace logic 403 is only reset as shown in Table 2.As shown in Table 2, trace logic 403 can only trace through reset whenthe debugger/emulator owns the reset and there is a functional reset.

The reset request is initiated via emulation hardware. The resetinformation from CPU core 201 cannot be used for trace collection 230.By the time such information is pipelined and sent to trace collection230, it misses the window in which the reset started. Therefore, thereset signal sent to trace collection 230 is a pipelined version of thereset sent to CPU core 201.

The user sees the following sequence:

1. Normal information traced;

2. Start of reset information;

3. Timing cycles indicating no activity;

4. Active timing bits indicating the activity of boot load code;

5. Stalls indicating the loading of instruction memory;

6. Exception to address 0, where the reset code resides.

The user can use this sequence to diagnose the probable location ofreset, the duration for reset and any other information that mightinterest him.

1. An apparatus for collecting trace data, comprising: a trace datainput for receiving trace data from a data processor; first and secondtrace circuit portions for processing the received trace data, one ofsaid first and second trace circuit portions coupled to said input, saidfirst and second trace circuit portions cooperable for producingprocessed trace data for trace analysis; and reset logic coupled to saidfirst and second trace circuit portions; wherein, in response to receiptof a reset signal under a first condition, said reset logic resets saidfirst trace circuit portion without resetting said second trace circuitportion; and wherein, in response to receipt of said reset signal undera second condition, said reset logic resets said second trace circuitportion.
 2. The apparatus of claim 1, wherein, in response to receipt ofsaid reset signal under said second condition, said reset logic resetssaid first trace circuit portion.
 3. The apparatus of claim 2, whereinsaid first condition is that said reset signal is owned by a debugger,and wherein said second condition is that said reset signal is one ofnot owned, and owned by an application program.
 4. The apparatus ofclaim 2, wherein, in response to receipt of said reset signal under athird condition, said reset logic permits both said first and secondtrace circuit portions to continue operation without reset.
 5. Theapparatus of claim 4, wherein said first condition is that said resetsignal is owned by a debugger, wherein said second condition is thatsaid reset signal is not owned, and wherein said third condition is thatsaid reset signal is owned by an application program.
 6. The apparatusof claim 1, wherein said first condition is that said reset signal isowned by a debugger, and wherein said second condition is that saidreset signal is one of not owned, and owned by an application program.7. The apparatus of claim 1, wherein, in response to receipt of saidreset signal under a third condition, said reset logic permits both saidfirst and second trace circuit portions to continue operation withoutreset.
 8. The apparatus of claim 7, wherein said first condition is thatsaid reset signal is owned by a debugger, wherein said second conditionis that said reset signal is not owned, and wherein said third conditionis that said reset signal is owned by an application program.
 9. Theapparatus of claim 1, wherein the data processor performs pipelined dataprocessing, and wherein said second trace circuit portion adjusts thereceived trace data to compensate for a pipelined data processingcharacteristic exhibited by the received trace data.
 10. The apparatusof claim 9, wherein said first condition is that said reset signal isowned by a debugger, and wherein said second condition is that saidreset signal is one of not owned, and owned by an application program.11. An integrated circuit apparatus, comprising: a data processor; atrace collector coupled to said data processor to receive trace datafrom said data processor, said trace collector including first andsecond trace circuit portions for processing the received trace data,said first and second trace circuit portions cooperable for producingprocessed trace data to be exported from the integrated circuit fortrace analysis externally of the integrated circuit; and reset logiccoupled to said first and second trace circuit portions; wherein, inresponse to receipt of a reset signal under a first condition, saidreset logic resets said first trace circuit portion without resettingsaid second trace circuit portion; and wherein, in response to receiptof said reset signal under a second condition, said reset logic resetssaid second trace circuit portion.
 12. The apparatus of claim 11,wherein, in response to receipt of said reset signal under said secondcondition, said reset logic resets said first trace circuit portion. 13.The apparatus of claim 12, wherein said first condition is that saidreset signal is owned by a debugger, and wherein said second conditionis that said reset signal is one of not owned, and owned by anapplication program.
 14. The apparatus of claim 12, wherein, in responseto receipt of said reset signal under a third condition, said resetlogic permits both said first and second trace circuit portions tocontinue operation without reset.
 15. The apparatus of claim 14, whereinsaid first condition is that said reset signal is owned by a debugger,wherein said second condition is that said reset signal is not owned,and wherein said third condition is that said reset signal is owned byan application program.
 16. The apparatus of claim 11, wherein saidfirst condition is that said reset signal is owned by a debugger, andwherein said second condition is that said reset signal is one of notowned, and owned by an application program.
 17. The apparatus of claim11, wherein, in response to receipt of said reset signal under a thirdcondition, said reset logic permits both said first and second tracecircuit portions to continue operation without reset.
 18. The apparatusof claim 17, wherein said first condition is that said reset signal isowned by a debugger, wherein said second condition is that said resetsignal is not owned, and wherein said third condition is that said resetsignal is owned by an application program.
 19. The apparatus of claim11, wherein said data processor performs pipelined data processing, andwherein said second trace circuit portion adjusts the received tracedata to compensate for a pipelined data processing characteristicexhibited by the received trace data.
 20. The apparatus of claim 19,wherein said first condition is that said reset signal is owned by adebugger, and wherein said second condition is that said reset signal isone of not owned, and owned by an application program.